ionscope
where nanoscience comes to life
Ionscope manufactures Scanning Ion Conductance Microscopes - using patented technology developed by a team of scientists from Imperial College London and Cambridge University.
Scanning Ion Conductance Microscopy (SICM) is the latest addition to the family of Scanning Probe Microscopes (SPM), offering high-resolution topographic imaging of immersed targets with zero contact — making SICM the first and only high-resolution imaging technique not to interact/interfere with the sample during image acquisition.
In March 2009, Ionscope introduced Hopping Mode SICM — taking the technique to the next level in versatility and usability. Whilst tall/convoluted surface features remain challenging for traditional raster-scanning SPM imaging techniques, the ICnano® can now for the first time routinely image almost any size and shape of feature up to 100 µm in height. This novel, non-contact approach makes the ICnano® scanning ion conductance microscope an ideal tool in the study of:
- Living cells/bacteria under physiological conditions — no fixing required
- Virology
- Soft surfaces such as polymers & lipid rafts
- Electrophysiology
- Neurology
- Dental / Bone applications
- Biofouling
- Corrosion
The ICnano® from Ionscope can also be combined with hybrid techniques:
